• Phase Identification of Polycrystalline Materials - Qualitative and Quantitative Analysis - In-situ High Temperature and Reaction Studies
• Materials Properties - Lattice Constants and Structural Refinements - Microcrystalline Properties from Line Profiles - Stress Analysis, In-situ Studies - Texture Analysis
• Surface and Thin Film Characterisation - Thickness, Roughness, Density - Polycrystalline Phase Identification - Preferred Orientation and Lattice Mismatch in Orientated Films - Lattice Mismatch of Strained Epitaxial Layers
• Surface Contamination and Trace Element Analysis - Wafer Contamination - Environmental Pollution
Warranty LabXA looks back to 35 years experience in the field of x-ray analysis. All investigations are carried out to the best of our knowledge in a minimum of time.